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        Nicomp Z3000 納米粒度及電位分析儀
        Nicomp Z3000 納米粒度及電位分析儀

        ·測量范圍:0.3nm-10.0μm

        ·工作原理:動態光散射

        ·電位范圍:0.3nm-100μm

        ·檢測角度:10°-175°多角度檢測及高濃度背光散射

        ·電源選項:220-240V,50Hz

        ·最小測樣量:10微升

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